Home > Products > IEC test Probes > standard test finger iec IEC61032 IEC60529 test probe D
standard test finger iec IEC61032 IEC60529 test probe D
- 100 Piece / Pieces per Month
- Shenzhen China
- T/T Credit Card
-
IEC 61032 children test finger probe for Electrical Safety testing lab children test probe
-
IEC61032 IP4X Test Probe D
-
Articulated test finger probe joint finger probe
-
High quality IP1X Test Probe A with 50MM diameter sphere
-
IEC 60335-1 Figure 7 Test Finger Nail with 30N Force Gauges
-
Short Test Pin Probe for IEC 61032 Test Probe 13, IEC 61032 Figure 9 Test Probe 13
Product Details
| Brand Name: | BONAD, BONAD | Place of Origin: | Guangdong, China | Model Number: | BND-D, BND-D |
Packaging Details
aluminum box +carton box
Product Description
IP4X Test Probe
IP4X Test Probe
Article NO.,BND-D
Basic Introduction:
1,According to: IEC61032:1997/IEC60529:2001 AND UL
Technical parameters
1, Test Probe Length :100mm
2, Test Probe Diameter:1.0mm
3,Dam- sphere Diameter:35mm
4,Handle Diameter:10mm
5,Handle Length 100mm
6, According to IEC61032 figure 4 (the Test probe D)
Application:
1, Standard test refers to the joint part can't touch the live parts or close to the dangerous parts, 30mm circular baffle can not be enter .
2,In the test requirement for preventing access to the hazardous parts, Test Probe D need to be with thrust 1±0.1N
Company Profile
14 Stanards drafted and issued by Labthink -- 100 Patents granted by Labthink -- 410 m2 Laboratory to provide testing services -- 20 years experienced lab technicians to provide solutions -- 12 months warranty -- Remote Services (Free of Charge allthrough lifetime)
Contact Us
- Shenzhen Bonad Instrument Co., Ltd.
-
IP2 Jointed Test Finger/ IEC Test Probe B standard test finger
-
IEC61032 IP2X Movable IEC Test Finger B
-
IEC61032 figure 3 wire testing probe
-
IEC61032 figure 2 test probe finger B
-
IEC61032 test fingernail with 50N force
-
IEC60335 figure 7 test fingernail / IP test probe
-
Articulated Test Finger for Electrical Safety Test
-
IEC60335-2-24 Scratch Tool Tip Test Probe
-
Promotion discount! IEC61032 figure 1 IP1X Test Probe A with a 50mm stainless sphere
-
IEC60884 IEC61032 Socket outlet protection test probe 14B
-
IP3X Accessibility Probes IEC 61032 Test Equipment Probe C
-
Promotion price! IEC60598 copper and zine alloy test chain
-
IEC61032 Accessibility probe test rod 41 with 30mm diameter and 80mm length
-
IEC61032 figure 31 Accessibility probe test cone
-
IEC60529 IP2X 12.5mm steel ball test probe with 50N force
-
IEC61032 IP2X accessibility probe B test finger for hazardous part
-
IP3X Test Probe from IEC61032 standard With 2.5mm Diameter
-
IEC61032 Test Probe 41
-
IEC60065 Creepage Distance Test Card used for compliance testing of electronic equipment and other products
-
Discount Sell! IEC60065 IEC60335 27 sizes Creepage Antistatic Distance Test Card
-
IEC60065 Creepage Distance Test Card for testing the creepage distance on circuit board
-
IEC60065 Creepage Distance Test Card 8size and 27 size
-
IP1X 50mm Test Sphere Probe A
-
IEC Probe 11 Figure 7 Rigid Finger Accessibility Test Probe
Find Similar Products By Category
- Measurement & Analysis Instruments > Instrument Parts & Accessories
Shenzhen Bonad Instrument Co., Ltd.
- Please Enter your Email Address
- Please enter the content for your inquiry.
We will find the most reliable suppliers for you according to your description.
Send Now-
sales
Welcome to my shop! Glad to serve you!Please send your question!
Your message has exceeded the limit.
- Contact supplier for lowest price
- Customized Request
- Request Sample
- Request Free Catalogs
Your message has exceeded the limit.
-
-
Your inquiry content must be between 20 to 5000 characters.Send Now.
-
Please input the mailbox.
-